Home > Products > Semiconductor > Electric Field Modulation Spectrophotometer

EMV-200 Electric Field Modulation Spectrophotometer

The EMV-200 electric field modulation spectrophotometer is capable of measuring changes in absorbance in the ultraviolet, visible and near-infrared region caused by application of an electrical field (several 100 V/µm) to film samples of optical performance materials. This system can perform quantitative measurement of changes in the dipole moment or polarizability and other characteristic sample parameters as a result of electronic excitation. This instrument is expected to extend the application to the evaluation of organic electro-luminescent (EL) materials, organic optical conversion molecules, and other molecular electronics elements. Furthermore, it will contribute to the elucidation of structures and functions related to optical excitation.


Optics Double beam
Wavelength range 190 - 3200 nm
Band width 0.1 - 10 nm (0.2 - 20 nm in NIR)
Measurement mode Abs., %T, Single beam, Electro-absorption (Iw/IDC, I2w/IDC)
Frequency 40 Hz, 100 Hz, 1 kHz, 10 kHz, 100 kHz
Modulation voltage 0 - 300 V
Detector PMT, Cooled InSb
Sample holder (option) Variable angle incidence (0° - 50°), Single reflection measurement unit

Copyright (c) 2013 JASCO International Co., Ltd. All right reserved