JASCO Asia Portal - FT/IR-6600 FT-IR Spectrometer -

FT-IR

FT-IR
FT/IR-4600	FT-IR Spectrometer
FT/IR-4700	FT-IR Spectrometer
FT/IR-6600	FT-IR Spectrometer
FT/IR-6700	FT-IR Spectrometer
FT/IR-6800	FT-IR Spectrometer
VIR-100 VIR-200 VIR-300	Versatile FT-IR Spectrometer
Infrared Microscope
IRT-5100	FT-IR Microscope
IRT-5200	FT-IR Microscope
IRT-7100	Fully Automated FT-IR Microscope
IRT-7200	Multi-channel FT-IR Microscope
Irtron µ	Sample Compartment Microscope
Clear-View ATR	FT-IR Microscope ATR Objectives
	Slice Master
FT-Raman
RFT-6000	FT-Raman Attachment
Vibrational CD Attachment
VFT-4000	VCD Attachment
FT-IR Accessories
ATR PRO ONE	Single reflection ATR accessory
DR PRO 410-M	Diffuse reflectance accessory
RAS PRO 410-H	Grazing angle reflectance accessory

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FT/IR-6600 FT-IR Spectrometer

The FT/IR-6600 offers the absolute highest level of performance in the industry with the highest signal-to-noise specifications. Designed for a wide range of critical research and development applications, the FT/IR-6600 is capable of measuring from the Visible (25,000 cm^-1) to the Far IR (50 cm^-1). Step scan, high resolution, and full vacuum options are available.
The FT/IR-6600 provides a high level of functionality and high accuracy measurement capability at a reasonable price.

Features:

Wavenumber Extension

The working range of any JASCO FT/IR-6000 Series instruments can be extended to cover Near to Far-IR applications by switching automatically various optical components, i.e., light source, beam splitter, and detector.

Rapid Scan

The Rapid Scan function is optional for the FT/IR-6600. The Rapid Scan system enables the instrument to perform up to 20 scans per second for the FT/IR-6600 providing real-time analysis of reaction kinetics.

Step Scan

Step Scan FT-IR spectroscopy offers the capability to obtain rapid time-resolved infrared measurements. This technique covers the entire mid-IR region allowing simultaneous measurement at all frequencies while maintaining the high throughput and multiplex advantages of FT-IR. The time-resolved Step Scan FT-IR technique involves displacing the moveable mirror of the interferometer in a step-wise manner. Using the Step Scan technique it is possible to monitor the progress of very fast and reproducible events.

Microscope/IR Imaging

JASCO offers vairous infrared microscope models which can be easily interfaced to any FT/IR-4000 or FT/IR-6000 instrument. When used with the FT/IR-6000 the IRT-7200 multi-channel infrared microscope offers advanced capability for applications such as time-resolved imaging.

IQ Accessory Recognition

IQ Accessory Recognition automatically recognizes the sampling accessory when inserted into the instrument sample compartment, using the previously declared instrument parameters for spectral data acquisition. The IQ System can be programmed for any commercially available sampling accessory.

Specifications:

Max resolution:	0.4cm^-1
S/N ratio:	45,000:1

Accessories:

Single reflection ATR attachment
Multi-reflections ATR attachment
Diffused reflectance attachment
Grazing angle reflection attachment
Polarizer
Pellet sampling accessory
Gas cells, liquid cells and mull cells
And many more!