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FT-IR Solutions

With over fifty years of experience in infrared spectroscopy, JASCO introduces a new series of advanced FT-IR instruments and sampling accessories. Now we offer the most complete selection of FT-IR capability from education and routine analysis to high performance research sysytems plus specially optimized dedicated systems for advanced technology applications such as measuring film thickness and CVD in-situ monitoring for semiconductor research.


FT-IR
FT/IR-4600 Spectrometer New!
FT/IR-4700 Spectrometer New!
FT/IR-6600 Spectrometer New!
FT/IR-6700 Spectrometer New!
FT/IR-6800 Spectrometer New!
VIR-100/200/300 Versatile FT-IR Spectrometer
FT-IR Microscope
IRT-5100 FT-IR Microscope New!
IRT-5200 FT-IR Microscope New!
IRT-7100 Fully Automated FT-IR Microscope New!
IRT-7200 Multi-channel FT-IR Microscope New!
Irtron µ Sample Compartment Microscope
Clear-View ATR Series FT-IR Microscope ATR Objectives
Slice Master
FT-Raman
RFT-6000 FT-Raman Attachment
Vibrational circular dichroism (VCD) attachment
VFT-4000 VCD attahcment
FT-IR Sampling Accessories
ATR PRO ONE High-throughput single reflection ATR accessory New!
DR PRO410-M Diffuse reflectance accessory
RAS PRO410-H Grazing angle reflectance accessory

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