 IRT-5000 Infrared Microscope
IRT-7000 Mulit-channel Infrared Microscope
FT-IR Microscopy and Imaging Systems
JASCO is proud to release two innovative FT-IR Microscope accessories, the IRT-5000 and IRT-7000, providing several new functions that drastically improve infrared microspectroscopy analyses. Both microscope systems can be easily interfaced with either the FT/IR-4000 or FT/IR-6000 spectrometer, offering the most advanced microscopy and imaging systems available in the market today. Coupling JASCO's proven technology for infrared spectroscopy (accumulated over 50 years) and with the most advanced optical design, the IRT-5000 and 7000 offer the best solution for even the most challenging sample analyses.
- High optical throughput
- Excellent signal to noise ratio
- High spatial resolution
- Operational flexibility
- Expandable capabilities
- Full range of accessories
 FT-IR Micro-area Analysis:
IQ Mapping™
JASCO's new FT-IR microscope systems feature an innovative capability for sample analysis, "IQ Mapping". This function enables automated multi-point mapping, line mapping and IR Imaging analyses of a microscopic area with a manual sample stage and a single element detector. The microscope system automatically scans the specified points or area, rapidly collecting a full spectrum of each point without moving the sample stage.
The IQ Mapping function can provide a measurement of a maximum area of 400 μm square using the 16× cassegrain objective. The combination of IQ Mapping with the automated XYZ stage provides a wide area analysis capability.
Sampling Flexibility:
A wide range of data acquisition modes provides the best solution for almost any type of sample and application.
- IQ Mapping
Single point
Multi-point
Line Mapping
Grid Mapping
Micro-ATR Mapping
- IQ Mapping with automatic X-Y-Z stage
Wide-area Mapping
Multi-ATR Mapping
- Linear array detector and rapid scan
IR Imaging
- Linear array detector and step scan
Dynamic Imaging
 ATR Mapping using the IQ Mapping function
Sample: silica bead (HPLC packing material)
Colored 3D display of Si-O peak area near 1100 cm-1
Sample: 2 µm Silica bead
Next Generation FT-IR Microscopes
 IRT-5000
Infrared Microscope
The IRT-5000 FT-IR Microscope employs a mid-band MCT detector as standard, while up to two detectors can be installed simultaneously. The standard "IQ Mapping" function allows multi-point, line, area and ATR mapping experiments without moving the sample stage, in addition to single-point measurements. An optional automatic X-Y-Z sample stage enables auto-focus and mapping analysis of large sample areas.
- IQ Mapping
- Dual detector capability
- Variety of measurement modes
(Transmission, reflection, ATR, Grazing Angle Reflectance)
- Multiple objective capabilities
- Field upgrade to IR Imaging using a linear array detector
 Exceptional visualobservation quality
A high-resolution CMOS video camera offers exceptional image quality in addition to a 3X optical zoom capability.
Next Generation FT-IR Microscopes
 IRT-7000
Multi-channel IR Microscope
The IRT-7000 FT-IR multi-channel microscope offers two detectors as standard, a 16-channel linear array detector and a single-point MCT detector. The combination of the standard automatic sample stage and "IQ Mapping" function allows mapping analyses of a large sample area, multi-area ATR mapping, and IR imaging of a specific area with extremely high spatial resolution and excellent sensitivity in a short time.
- IQ Mapping
- Full IR Imaging function
- Up to four objectives
- Wide area mapping and multi-ATR imaging
- Dynamic Imaging with FT-IR step-scan option
- Multivariate analysis PCA
(Principal Component Analysis) (standard)
Exceptional visualobservation quality
 The World's first cross platform software
Spectra Manager™ II
Microscope interface
A full-featured software package, Spectra Manager II provides convenient, and/or automatic functions and simplified operational procedures to minimize manual operations. Powerful data processing functions include 2-D and/or 3-D visualization of chemical information with all standard manipulation of spectral data.
- Superior user-friendly graphical interface
- Auto-focus/Auto-illumination
- Registration of commonly used aperture settings
- Automatic recognition of microscope objectives
Thumbnail display
- (memorizing the sample position with focus and aperture information)
- Spectrum preview to check conditions
before measurement
- IQ Monitoring for simultaneous observation of
the spectrum and sample image
- Data storage linked with sample image and
aperture information
- Report publishing capability (JASCO Canvas)
 Expandability
A wide range of optional accessories is available. The microscope system can be optimized for sample application requirements.
- 5.7 inch TFT color display or Binocular
- Joystick for automated stage control
- Wavelength extension options
- ATR objectives and pressure sensor
- Grazing angle objective and IR polarizer
- Sample purge and vacuum options
- Sample observation options
(Visible polarizer, Fluorescence observation,
Refractive objectives (10x, 20x), etc.)
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