| IRT-5200 FT-IR Microscope
Micro FT-IR has generally been reserved for measuring specified samples such as small contaminants on polymer films or micro samples transferred to infrared transparent windows. Today, JASCO’ s innovative FT-IR Microscopes, the IRT-5000/7000 Series, provide new functions that dramatically improve infrared micro-spectroscopy analyses. These microscope systems can be easily interfaced with the FT/IR-4000 or FT/IR-6000 series spectrometers, offering the most advanced microscopy and imaging systems available in the market.
Coupling JASCO’ s proven technology for infrared spectroscopy, accumulated over 50 years, with the most advanced optical design, the IRT-5000/7000 Series offer the best solution for even the most challenging sample analyses.
The IRT-5200 FT-IR microscope utilizes a standard mid-band MCT detector, while up to two detectors can be simultaneously installed as an option. The standard “IQ Mapping” function allows multi-point, line, area and ATR mapping experiments without moving the sample stage, in addition to single-point measurements. An optional automatic XYZ sample stage enables auto-focus and mapping analysis of larger sample areas.
- IQ Mapping
- Dual detector capability
- Variety of measurement modes (Transmission, reflection, ATR, Grazing Angle Reflection)
- Multiple objective capabilities
- Field upgrade to IR Imaging System using a linear array detector
FT-IR Micro-area Analysis:
JASCO's new FT-IR microscope systems feature an innovative capability for sample analysis, "IQ Mapping". This function enables automated multi-point mapping, line mapping and IR Imaging analyses of a microscopic area with a manual sample stage and a single element detector. The microscope system automatically scans the specified points or area, rapidly collecting a full spectrum of each point without moving the sample stage.
The IQ Mapping function can provide a measurement of a maximum area of 400 µm square using the 16x cassegrain objective. The combination of IQ Mapping with the automated XYZ stage provides a wide area analysis capability.
A wide range of data acquisition modes provides the best solution for almost any type of sample and application.
- IQ Mapping
- IQ Mapping with automatic X-Y-Z stage
- Linear array detector and rapid scan
- Linear array detector and step scan
ATR Mapping using the IQ Mapping function
Sample: silica bead (HPLC packing material)
Colored 3D display of Si-O peak area near 1100 cm-1
Sample: 2 µm Silica bead
Exceptional visualobservation quality
A high-resolution CMOS video camera offers exceptional image quality in addition to a 3X optical zoom capability.
A wide range of optional accessories is available. The microscope system can be optimized for sample application requirements.
- 5.7 inch TFT color display or Binocular
- Joystick for automated stage control
- Wavelength extension options
- ATR objectives and pressure sensor
- Grazing angle objective and IR polarizer
- Sample purge and vacuum options
- Sample observation options
(Visible polarizer, Fluorescence observation,
Refractive objectives (10x, 20x), etc.)