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V-7000 Series Absolut Reflectance Measurement System

The absolute reflectance measurement system automates the measurement of the spectral properties, film thickness, angle variation or other characteristics of solid samples such as semiconductors, thin films and various optical elements. Coupled with the JASCO V-7000 UV/Vis/NIR Spectrophotometers, the system enables measurements of challenging samples wiith dramatically reduced noise and excellent photometric stability. The incidence and collection angles can be set in a synchronous mode, simultaneously rotating the sample stage and integrating sphere. Alternatively, the incidence and collection angles can be individually declared in an asynchronous mode. The polarization properties of a sample can be examined using P or S polarization or by setting the desired polarization angles.

  • PC control of instrument conditions such as incidence and collection angles and spectrum measurement parameters.
  • Wide range of instrument wavelengths, from the ultraviolet to near infrared region.
  • Superior photometric stability using double-beam optical configuration.
  • Individual control of incidence and collection angles.
  • Standard polarization measurement capability.
  • Purpose-built sample holder simplifies loading/removal of samples


Wavelength range: 230nm to 850nm (ARV-701)
230nm to 2200nm (ARV-702)
230nm to 1650nm (ARV-703)
Incident angle: 5° to 60° (Reflectance mode)
0° to 60° (Trancemittance mode)
Sample dimensions: Minimum 20(H) x 20(W) x 0.5(T) mm
Maximum 70(H) x 100(W) x 10(T) mm
Detectors PMT (all models),
PbS (ARV-702),
InGaAs (ARV-703)

Varying the incident angle, the transmittance characteristics of a band pass filter are measured. As shown above, the transmittance peak of the band pass filter is shifted about 8 nm to a shorter wavelength range as the incident angle is changed from 0 to 10 degrees.

Varying the incident angle, the reflectance characteristics of a dichroic mirror using P and S polarization are measured.

Spctra Manager™ Suite

JASCO's Spectra Manager™ Suite is a powerful, cross platform Windows based software package for controlling a wide range of spectroscopic instrumentation. Spectra Manager offers a comprehensive capability for capturing and processing data and eliminates the need to learn multiple software packages.

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